Electromigration Analysis in Ansys SIwave

Electromigration models

Electromigration is the transport of material caused by the gradual movement of ions in a conductor due to momentum transfer between conducting electrons and diffusing metal atoms

The recent release of Ansys SIwave have customized this electromigration calculation for PCBs, allowing  users to calculate MTTF based on Black’s equation with just a couple of simple clicks.