ANSYS, knowing the problems EMI can cause when designing electronic devices, has invested in an EMI Scanner workflow in SIwave and HFSS. EMI issues found late can be costly but difficult to always know upfront. The New EMI Scanner can quickly scan entire design for rules violations which can cause EMI problems. Users can even define custom rules files as a subset. The result is detection early in the design phase before you get to more costly downstream stages.
ANSYS, knowing the problems EMI can cause when designing electronic devices, has invested in an EMI Scanner workflow in SIwave and HFSS. EMI issues found late can be costly but difficult to always know upfront. The New EMI Scanner can quickly scan entire design for rules violations which can cause EMI problems. Users can even define custom rules files as a subset. The result is detection early in the design phase before you get to more costly downstream stages. 